APA (7th ed.) Citation

Goh, S. H., Pan, Y., You, G. F., Chan, Y. H., ran, H., Herrman, T., . . . Tan, S. H. (2012). Effectiveness of frequency mapping on 28 nm device broken scan chain failures. Review of Scientific Instruments, 83(2), 023702. https://doi.org/10.1063/1.3680584

Chicago Style (17th ed.) Citation

Goh, S. H., et al. "Effectiveness of Frequency Mapping on 28 Nm Device Broken Scan Chain Failures." Review of Scientific Instruments 83, no. 2 (2012): 023702. https://doi.org/10.1063/1.3680584.

MLA (9th ed.) Citation

Goh, S. H., et al. "Effectiveness of Frequency Mapping on 28 Nm Device Broken Scan Chain Failures." Review of Scientific Instruments, vol. 83, no. 2, 2012, p. 023702, https://doi.org/10.1063/1.3680584.