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Effectiveness of frequency mapping on 28 nm device broken scan chain failures.

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Title: Effectiveness of frequency mapping on 28 nm device broken scan chain failures.
Authors: Goh, S. H.1, Pan, Yan1, You, G. F.1, Chan, Y. H.1, ran, He1, Herrman, Thomas2, Heller, Thomas2, Lim, Victor S. K.1, Mai, Z. H.1, Lam, Jeffrey1, Chua, C. M.3, Chua, W. P.3, Tan, S. H.3
Source: Review of Scientific Instruments; Feb2012, Vol. 83 Issue 2, p023702, 8p, 3 Black and White Photographs, 8 Diagrams, 3 Graphs
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 72107660
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PubType: Academic Journal
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        Value: 10.1063/1.3680584
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              Text: Feb2012
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