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High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics.

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Title: High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics.
Authors: Huey, Bryan D.1, Nath Premnath, Ramesh1, Lee, Sungjun1,2, Polomoff, Nicholas A.1, Green, D. J.
Source: Journal of the American Ceramic Society; Apr2012, Vol. 95 Issue 4, p1147-1162, 16p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+the+American+Ceramic+Society%22">Journal of the American Ceramic Society</searchLink>; Apr2012, Vol. 95 Issue 4, p1147-1162, 16p
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        Value: 10.1111/j.1551-2916.2012.05099.x
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      – Code: eng
        Text: English
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        PageCount: 16
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      – TitleFull: High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics.
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            NameFull: Lee, Sungjun
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              Text: Apr2012
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              Y: 2012
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