High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics.
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| Title: | High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics. |
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| Authors: | Huey, Bryan D.1, Nath Premnath, Ramesh1, Lee, Sungjun1,2, Polomoff, Nicholas A.1, Green, D. J. |
| Source: | Journal of the American Ceramic Society; Apr2012, Vol. 95 Issue 4, p1147-1162, 16p |
| Database: | Applied Science & Technology Source |
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