Schropp, A., Hoppe, R., Patommel, J., Samberg, D., Seiboth, F., Stephan, S., . . . Schroer, C. G. (2012). Hard x-ray scanning microscopy with coherent radiation: Beyond the resolution of conventional x-ray microscopes. Applied Physics Letters, 100(25), 253112. https://doi.org/10.1063/1.4729942
Chicago Style (17th ed.) CitationSchropp, A., R. Hoppe, J. Patommel, D. Samberg, F. Seiboth, S. Stephan, G. Wellenreuther, G. Falkenberg, and C. G. Schroer. "Hard X-ray Scanning Microscopy with Coherent Radiation: Beyond the Resolution of Conventional X-ray Microscopes." Applied Physics Letters 100, no. 25 (2012): 253112. https://doi.org/10.1063/1.4729942.
MLA (9th ed.) CitationSchropp, A., et al. "Hard X-ray Scanning Microscopy with Coherent Radiation: Beyond the Resolution of Conventional X-ray Microscopes." Applied Physics Letters, vol. 100, no. 25, 2012, p. 253112, https://doi.org/10.1063/1.4729942.