Schoelz, J. K., Xu, P., Barber, S. D., Qi, D., Ackerman, M. L., Basnet, G., . . . Thibado, P. M. (2012). High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy. Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 30(3), 033201. https://doi.org/10.1116/1.3701977
Chicago Style (17th ed.) CitationSchoelz, James K., Peng Xu, Steven D. Barber, Dejun Qi, Matthew L. Ackerman, Gobind Basnet, Cameron T. Cook, and Paul M. Thibado. "High-percentage Success Method for Preparing and Pre-evaluating Tungsten Tips for Atomic-resolution Scanning Tunneling Microscopy." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics 30, no. 3 (2012): 033201. https://doi.org/10.1116/1.3701977.
MLA (9th ed.) CitationSchoelz, James K., et al. "High-percentage Success Method for Preparing and Pre-evaluating Tungsten Tips for Atomic-resolution Scanning Tunneling Microscopy." Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, vol. 30, no. 3, 2012, p. 033201, https://doi.org/10.1116/1.3701977.
