High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy.
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| Title: | High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy. |
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| Authors: | Schoelz, James K.1, Xu, Peng1, Barber, Steven D.1, Qi, Dejun1, Ackerman, Matthew L.1, Basnet, Gobind1, Cook, Cameron T.1, Thibado, Paul M.1 |
| Source: | Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; May2012, Vol. 30 Issue 3, p033201-033201-5, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 21662746 |
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| DOI: | 10.1116/1.3701977 |
