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High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy.

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Title: High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy.
Authors: Schoelz, James K.1, Xu, Peng1, Barber, Steven D.1, Qi, Dejun1, Ackerman, Matthew L.1, Basnet, Gobind1, Cook, Cameron T.1, Thibado, Paul M.1
Source: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; May2012, Vol. 30 Issue 3, p033201-033201-5, 1p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 85464454
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=85464454
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        Value: 10.1116/1.3701977
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      – Code: eng
        Text: English
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        StartPage: 033201
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      – TitleFull: High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy.
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            NameFull: Schoelz, James K.
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              Text: May2012
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              Y: 2012
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            – TitleFull: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics
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