High-percentage success method for preparing and pre-evaluating tungsten tips for atomic-resolution scanning tunneling microscopy. - Schoelz, James K.; Xu, Peng; Barber, Steven D.; Qi, Dejun; Ackerman, Matthew L.; Basnet, Gobind; Cook, Cameron T.; Thibado, Paul M. (Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics, 2012)