High-Temperature Measurement of Seebeck Coefficient and Electrical Conductivity.

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Title: High-Temperature Measurement of Seebeck Coefficient and Electrical Conductivity.
Authors: Boor, J.1, johannes.deboor@dlr.de, Stiewe, C.1, Ziolkowski, P.1, Dasgupta, T.1, Karpinski, G.1, Lenz, E.2, Edler, F.2, Mueller, E.1
Source: Journal of Electronic Materials; Jul2013, Vol. 42 Issue 7, p1711-1718, 8p, 1 Diagram, 9 Graphs
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 88368570
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: High-Temperature Measurement of Seebeck Coefficient and Electrical Conductivity.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=88368570
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s11664-012-2404-z
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 1711
    Titles:
      – TitleFull: High-Temperature Measurement of Seebeck Coefficient and Electrical Conductivity.
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            NameFull: Boor, J.
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            NameFull: Stiewe, C.
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            NameFull: Ziolkowski, P.
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            NameFull: Dasgupta, T.
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            NameFull: Karpinski, G.
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            NameFull: Lenz, E.
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            NameFull: Edler, F.
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            – D: 01
              M: 07
              Text: Jul2013
              Type: published
              Y: 2013
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              Value: 42
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              Value: 7
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            – TitleFull: Journal of Electronic Materials
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