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Functional Delay Test Generation Approach Using a Software Prototype of the Circuit.

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Title: Functional Delay Test Generation Approach Using a Software Prototype of the Circuit.
Authors: Bareiša, Eduardas1, eduardas.bareisa@ktu.lt, Jusas, Vacius1, vacius.jusas@ktu.lt, Motiejūnas, Kęstutis1, kestutis.motiejunas@ktu.lt, Šeinauskas, Rimantas1, rimantas.seinauskas@ktu.lt
Source: Computer Science & Information Systems; Jun2013, Vol. 10 Issue 3, p1165-1184, 20p
Database: Applied Science & Technology Source
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        Value: 10.2298/CSIS120416019B
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              Text: Jun2013
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