Functional Delay Test Generation Approach Using a Software Prototype of the Circuit.
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| Title: | Functional Delay Test Generation Approach Using a Software Prototype of the Circuit. |
|---|---|
| Authors: | Bareiša, Eduardas1, eduardas.bareisa@ktu.lt, Jusas, Vacius1, vacius.jusas@ktu.lt, Motiejūnas, Kęstutis1, kestutis.motiejunas@ktu.lt, Šeinauskas, Rimantas1, rimantas.seinauskas@ktu.lt |
| Source: | Computer Science & Information Systems; Jun2013, Vol. 10 Issue 3, p1165-1184, 20p |
| Database: | Applied Science & Technology Source |
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