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Interconnect reliability analysis of ULSI using automated model generation algorithm.

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Title: Interconnect reliability analysis of ULSI using automated model generation algorithm.
Authors: Lin, Qian1,2, Fu, Haipeng1, Na, Weicong1, He, Feifei3, Li, Xi1, Cheng, Qianfu1, Zhu, Yuanyuan1
Source: International Journal of RF & Microwave Computer-Aided Engineering. Aug2016, Vol. 26 Issue 6, p481-488. 8p. 3 Diagrams, 2 Charts, 4 Graphs.
Database: Academic Search Ultimate
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DbLabel: Academic Search Ultimate
An: 116858060
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PubType: Academic Journal
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+RF+%26+Microwave+Computer-Aided+Engineering%22">International Journal of RF & Microwave Computer-Aided Engineering</searchLink>. Aug2016, Vol. 26 Issue 6, p481-488. 8p. 3 Diagrams, 2 Charts, 4 Graphs.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=116858060
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        Value: 10.1002/mmce.20992
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      – Code: eng
        Text: English
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            – D: 01
              M: 08
              Text: Aug2016
              Type: published
              Y: 2016
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