APA (7th ed.) Citation

Dai, M., Guo, W., Liu, X., Zhang, M., Wang, Y., Wei, L. F., . . . Vissers, M. R. (2019). Measurement of Optical Constants of TiN and TiN/Ti/TiN Multilayer Films for Microwave Kinetic Inductance Photon-Number-Resolving Detectors. Journal of Low Temperature Physics, 194(5/6), 361. https://doi.org/10.1007/s10909-018-2095-9

Chicago Style (17th ed.) Citation

Dai, M., et al. "Measurement of Optical Constants of TiN and TiN/Ti/TiN Multilayer Films for Microwave Kinetic Inductance Photon-Number-Resolving Detectors." Journal of Low Temperature Physics 194, no. 5/6 (2019): 361. https://doi.org/10.1007/s10909-018-2095-9.

MLA (9th ed.) Citation

Dai, M., et al. "Measurement of Optical Constants of TiN and TiN/Ti/TiN Multilayer Films for Microwave Kinetic Inductance Photon-Number-Resolving Detectors." Journal of Low Temperature Physics, vol. 194, no. 5/6, 2019, p. 361, https://doi.org/10.1007/s10909-018-2095-9.