Cation composition ratio and channel length effects on bias stress instability in amorphous InGaZnO back-end-of-line field-effect transistors. - Kim, Donguk; Lee, Dayeon; Kim, Wonjung; Lee, Ho Jung; Kim, Changwook; Lee, Kwang-Hee; Jung, Moonil; Yang, Jee-Eun; Jang, Younjin; Kim, Sungjun; Kim, Sangwook; Kim, Dae Hwan (Scientific Reports, 2024)