APA (7th ed.) Citation

Zhang, H., Li, Y., Chang, H., Yu, Y., Wang, G., Wang, Y., & Lu, Z. (2025). Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure. Applied Physics B: Lasers & Optics, 131(4), 1. https://doi.org/10.1007/s00340-025-08427-w

Chicago Style (17th ed.) Citation

Zhang, Hai-Xin, Yun-Fei Li, Hao Chang, Yu Yu, Gong Wang, Yu-Lei Wang, and Zhi-Wei Lu. "Investigation of the Damage Profiles and Mechanisms of CMOS Devices Subjected to Continuous and Pulsed Laser Exposure." Applied Physics B: Lasers & Optics 131, no. 4 (2025): 1. https://doi.org/10.1007/s00340-025-08427-w.

MLA (9th ed.) Citation

Zhang, Hai-Xin, et al. "Investigation of the Damage Profiles and Mechanisms of CMOS Devices Subjected to Continuous and Pulsed Laser Exposure." Applied Physics B: Lasers & Optics, vol. 131, no. 4, 2025, p. 1, https://doi.org/10.1007/s00340-025-08427-w.