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Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure.

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Title: Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure.
Authors: Zhang, Hai-Xin1 (AUTHOR), Li, Yun-Fei1,2 (AUTHOR) yfli@hebut.edu.cn, Chang, Hao3 (AUTHOR) changhao5976911@163.com, Yu, Yu1,2 (AUTHOR), Wang, Gong1,2 (AUTHOR), Wang, Yu-Lei1,2 (AUTHOR), Lu, Zhi-Wei1,2 (AUTHOR)
Source: Applied Physics B: Lasers & Optics. Apr2025, Vol. 131 Issue 4, p1-13. 13p.
Database: Academic Search Ultimate
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An: 184706298
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  Data: Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure.
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  Data: <searchLink fieldCode="AR" term="%22Zhang%2C+Hai-Xin%22">Zhang, Hai-Xin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Li%2C+Yun-Fei%22">Li, Yun-Fei</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> yfli@hebut.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Chang%2C+Hao%22">Chang, Hao</searchLink><relatesTo>3</relatesTo> (AUTHOR)<i> changhao5976911@163.com</i><br /><searchLink fieldCode="AR" term="%22Yu%2C+Yu%22">Yu, Yu</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wang%2C+Gong%22">Wang, Gong</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wang%2C+Yu-Lei%22">Wang, Yu-Lei</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lu%2C+Zhi-Wei%22">Lu, Zhi-Wei</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+B%3A+Lasers+%26+Optics%22">Applied Physics B: Lasers & Optics</searchLink>. Apr2025, Vol. 131 Issue 4, p1-13. 13p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=184706298
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s00340-025-08427-w
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      – Code: eng
        Text: English
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        PageCount: 13
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      – TitleFull: Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure.
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          Name:
            NameFull: Zhang, Hai-Xin
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            NameFull: Li, Yun-Fei
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            NameFull: Chang, Hao
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            NameFull: Yu, Yu
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            NameFull: Wang, Gong
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            NameFull: Wang, Yu-Lei
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            NameFull: Lu, Zhi-Wei
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            – D: 01
              M: 04
              Text: Apr2025
              Type: published
              Y: 2025
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              Value: 131
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            – TitleFull: Applied Physics B: Lasers & Optics
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