Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure.
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| Title: | Investigation of the damage profiles and mechanisms of CMOS devices subjected to continuous and pulsed laser exposure. |
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| Authors: | Zhang, Hai-Xin1 (AUTHOR), Li, Yun-Fei1,2 (AUTHOR) yfli@hebut.edu.cn, Chang, Hao3 (AUTHOR) changhao5976911@163.com, Yu, Yu1,2 (AUTHOR), Wang, Gong1,2 (AUTHOR), Wang, Yu-Lei1,2 (AUTHOR), Lu, Zhi-Wei1,2 (AUTHOR) |
| Source: | Applied Physics B: Lasers & Optics. Apr2025, Vol. 131 Issue 4, p1-13. 13p. |
| Database: | Academic Search Ultimate |
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