Causal Relationship between Current Sheet Flapping, Electron-only Reconnection, and Ion-coupled Reconnection. - Hwang, K.-J.; Dokgo, K.; Choi, E.; Burch, J. L.; Bessho, N.; Hasegawa, H.; Nakamura, R.; Escoubet, C. P.; Fu, H. S.; Fu, W. D.; Pollock, C. J. (Astrophysical Journal, 2026)