APA (7th ed.) Citation

Laverock, J., & Fox, N. (2026). Quantitative Model of Internal Analyzer Scattering in a Hemispherical Electron Analyzer and Its Application to Improve the Accuracy of the Transmission Function. Surface & Interface Analysis: SIA, 1. https://doi.org/10.1002/sia.70069

Chicago Style (17th ed.) Citation

Laverock, J., and N. A Fox. "Quantitative Model of Internal Analyzer Scattering in a Hemispherical Electron Analyzer and Its Application to Improve the Accuracy of the Transmission Function." Surface & Interface Analysis: SIA 2026: 1. https://doi.org/10.1002/sia.70069.

MLA (9th ed.) Citation

Laverock, J., and N. A Fox. "Quantitative Model of Internal Analyzer Scattering in a Hemispherical Electron Analyzer and Its Application to Improve the Accuracy of the Transmission Function." Surface & Interface Analysis: SIA, 2026, p. 1, https://doi.org/10.1002/sia.70069.