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Quantitative Model of Internal Analyzer Scattering in a Hemispherical Electron Analyzer and Its Application to Improve the Accuracy of the Transmission Function.

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Title: Quantitative Model of Internal Analyzer Scattering in a Hemispherical Electron Analyzer and Its Application to Improve the Accuracy of the Transmission Function.
Authors: Laverock, J.1 (AUTHOR) j.laverock@bristol.ac.uk, Fox, N. A.1,2 (AUTHOR)
Source: Surface & Interface Analysis: SIA. Mar2026, p1. 15p. 9 Illustrations.
Database: Academic Search Ultimate
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  Availability: 0
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AccessLevel: 2
PubType: Academic Journal
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  Data: Quantitative Model of Internal Analyzer Scattering in a Hemispherical Electron Analyzer and Its Application to Improve the Accuracy of the Transmission Function.
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  Data: <searchLink fieldCode="JN" term="%22Surface+%26+Interface+Analysis%3A+SIA%22">Surface & Interface Analysis: SIA</searchLink>. Mar2026, p1. 15p. 9 Illustrations.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192244201
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1002/sia.70069
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      – Code: eng
        Text: English
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        PageCount: 15
        StartPage: 1
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      – TitleFull: Quantitative Model of Internal Analyzer Scattering in a Hemispherical Electron Analyzer and Its Application to Improve the Accuracy of the Transmission Function.
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            NameFull: Laverock, J.
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            NameFull: Fox, N. A.
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            – D: 13
              M: 03
              Text: Mar2026
              Type: published
              Y: 2026
          Identifiers:
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              Value: 01422421
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            – TitleFull: Surface & Interface Analysis: SIA
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