APA (7th ed.) Citation

Lozano, Y., Levy, D., & Salazar-Bloise, F. (2026). Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films. Sensors (14248220), 26(5), 1431. https://doi.org/10.3390/s26051431

Chicago Style (17th ed.) Citation

Lozano, Yaiza, David Levy, and Félix Salazar-Bloise. "Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films." Sensors (14248220) 26, no. 5 (2026): 1431. https://doi.org/10.3390/s26051431.

MLA (9th ed.) Citation

Lozano, Yaiza, et al. "Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films." Sensors (14248220), vol. 26, no. 5, 2026, p. 1431, https://doi.org/10.3390/s26051431.