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Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films.

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Title: Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films.
Authors: Lozano, Yaiza1 (AUTHOR), Levy, David1,2 (AUTHOR) david.levy@icmm.csic.es, Salazar-Bloise, Félix1,2 (AUTHOR)
Source: Sensors (14248220). Mar2026, Vol. 26 Issue 5, p1431. 20p.
Database: Academic Search Ultimate
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An: 192638858
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PubType: Academic Journal
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  Data: Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films.
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  Data: <searchLink fieldCode="AR" term="%22Lozano%2C+Yaiza%22">Lozano, Yaiza</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Levy%2C+David%22">Levy, David</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> david.levy@icmm.csic.es</i><br /><searchLink fieldCode="AR" term="%22Salazar-Bloise%2C+Félix%22">Salazar-Bloise, Félix</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Sensors+%2814248220%29%22">Sensors (14248220)</searchLink>. Mar2026, Vol. 26 Issue 5, p1431. 20p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=192638858
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        Value: 10.3390/s26051431
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      – Code: eng
        Text: English
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        StartPage: 1431
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      – TitleFull: Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films.
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            NameFull: Lozano, Yaiza
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            NameFull: Levy, David
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              Text: Mar2026
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              Y: 2026
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