Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films.
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| Title: | Polarization-Resolved Speckle Technique for Rapid Non-Destructive Characterization of Macroporous Silica Thin Films. |
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| Authors: | Lozano, Yaiza1 (AUTHOR), Levy, David1,2 (AUTHOR) david.levy@icmm.csic.es, Salazar-Bloise, Félix1,2 (AUTHOR) |
| Source: | Sensors (14248220). Mar2026, Vol. 26 Issue 5, p1431. 20p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 14248220 |
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| DOI: | 10.3390/s26051431 |
