APA (7th ed.) Citation

Chen, Y., Wang, Y., Hong, Z., Wang, C., Wang, Y., De Cheng, J., . . . Wu, W. (2026). Epitaxial Bi2O2Se/Bi2O5Se Thin Films: Revealing Electric‐Field‐Driven Oxidation and Resistive Switching Dynamics for Advanced Memory Devices. Advanced Science, 1. https://doi.org/10.1002/advs.75508

Chicago Style (17th ed.) Citation

Chen, Yen‐Jung, Yong‐Jyun Wang, Zi‐Qin Hong, Chien‐Hua Wang, Yi‐Ning Wang, Jia De Cheng, Chun‐Wei Huang, Ying‐Hao Chu, and Wen‐Wei Wu. "Epitaxial Bi2O2Se/Bi2O5Se Thin Films: Revealing Electric‐Field‐Driven Oxidation and Resistive Switching Dynamics for Advanced Memory Devices." Advanced Science 2026: 1. https://doi.org/10.1002/advs.75508.

MLA (9th ed.) Citation

Chen, Yen‐Jung, et al. "Epitaxial Bi2O2Se/Bi2O5Se Thin Films: Revealing Electric‐Field‐Driven Oxidation and Resistive Switching Dynamics for Advanced Memory Devices." Advanced Science, 2026, p. 1, https://doi.org/10.1002/advs.75508.