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Epitaxial Bi2O2Se/Bi2O5Se Thin Films: Revealing Electric‐Field‐Driven Oxidation and Resistive Switching Dynamics for Advanced Memory Devices.

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Title: Epitaxial Bi2O2Se/Bi2O5Se Thin Films: Revealing Electric‐Field‐Driven Oxidation and Resistive Switching Dynamics for Advanced Memory Devices.
Authors: Chen, Yen‐Jung1 (AUTHOR), Wang, Yong‐Jyun2 (AUTHOR), Hong, Zi‐Qin1 (AUTHOR), Wang, Chien‐Hua1 (AUTHOR), Wang, Yi‐Ning1 (AUTHOR), De Cheng, Jia1 (AUTHOR), Huang, Chun‐Wei3 (AUTHOR), Chu, Ying‐Hao2 (AUTHOR), Wu, Wen‐Wei1,4 (AUTHOR) wwwu@nycu.edu.tw
Source: Advanced Science. May2026, p1. 12p. 7 Illustrations.
Database: Academic Search Ultimate
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An: 193520007
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PubType: Academic Journal
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  Data: Epitaxial Bi2O2Se/Bi2O5Se Thin Films: Revealing Electric‐Field‐Driven Oxidation and Resistive Switching Dynamics for Advanced Memory Devices.
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Science%22">Advanced Science</searchLink>. May2026, p1. 12p. 7 Illustrations.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=193520007
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        Value: 10.1002/advs.75508
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        Text: English
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        PageCount: 12
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      – TitleFull: Epitaxial Bi2O2Se/Bi2O5Se Thin Films: Revealing Electric‐Field‐Driven Oxidation and Resistive Switching Dynamics for Advanced Memory Devices.
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              Text: May2026
              Type: published
              Y: 2026
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