High-performance RT-DETR model for industrial defect detection with semantic guidance and hierarchical attention.

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Title: High-performance RT-DETR model for industrial defect detection with semantic guidance and hierarchical attention.
Authors: Huang, Jin1 (AUTHOR) 100899@cqipc.edu.cn, Gu, Bin1 (AUTHOR), Tang, Yunlong1 (AUTHOR), Xu, Bingyue1 (AUTHOR), Li, Puxuan1 (AUTHOR), Ye, Jiayu1 (AUTHOR), Xu, Jingwen1 (AUTHOR), Zhang, Taihua1 (AUTHOR)
Source: PLoS ONE. 5/12/2026, Vol. 21 Issue 5, p1-27. 27p.
Database: Academic Search Ultimate
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  Data: High-performance RT-DETR model for industrial defect detection with semantic guidance and hierarchical attention.
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  Data: <searchLink fieldCode="AR" term="%22Huang%2C+Jin%22">Huang, Jin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> 100899@cqipc.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Gu%2C+Bin%22">Gu, Bin</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Tang%2C+Yunlong%22">Tang, Yunlong</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xu%2C+Bingyue%22">Xu, Bingyue</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Li%2C+Puxuan%22">Li, Puxuan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ye%2C+Jiayu%22">Ye, Jiayu</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Xu%2C+Jingwen%22">Xu, Jingwen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Zhang%2C+Taihua%22">Zhang, Taihua</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22PLoS+ONE%22">PLoS ONE</searchLink>. 5/12/2026, Vol. 21 Issue 5, p1-27. 27p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=193688860
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        Value: 10.1371/journal.pone.0348807
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        Text: English
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      – TitleFull: High-performance RT-DETR model for industrial defect detection with semantic guidance and hierarchical attention.
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              Text: 5/12/2026
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