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High-temperature memristors enabled by interfacial engineering.

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Title: High-temperature memristors enabled by interfacial engineering.
Authors: Zhao, Jian1 (AUTHOR), Jorgensen, Cameron S.2 (AUTHOR), Mahalingam, Krishnamurthy2 (AUTHOR), Bowers, Cynthia2 (AUTHOR), Sugimoto, Wataru3 (AUTHOR), Ito, Kai3 (AUTHOR), Kim, Seung Ju1 (AUTHOR), Zhao, Ruoyu1 (AUTHOR), Xu, Yichun1 (AUTHOR), Liao, Han-Ting1 (AUTHOR), Kalia, Rajiv K.4 (AUTHOR), Nakano, Aiichiro4 (AUTHOR), Shimamura, Kohei3 (AUTHOR), Shimojo, Fuyuki3 (AUTHOR), Vashishta, Priya4 (AUTHOR), Roy, Ajit K.2 (AUTHOR), Ge, Ning5 (AUTHOR), Hu, Miao5 (AUTHOR), Williams, R. Stanley1 (AUTHOR), Xia, Qiangfei5,6 (AUTHOR)
Source: Science. 5/14/2026, Vol. 392 Issue 6799, p771-779. 9p.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="JN" term="%22Science%22">Science</searchLink>. 5/14/2026, Vol. 392 Issue 6799, p771-779. 9p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=193758376
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