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Hard x-ray nanobeam characterization by coherent diffraction microscopy.

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Title: Hard x-ray nanobeam characterization by coherent diffraction microscopy.
Authors: Schropp, A.1 andreas.schropp@physik.tu-dresden.de, Boye, P.1, Feldkamp, J. M.1, Hoppe, R.1, Patommel, J.1, Samberg, D.1, Stephan, S.1, Giewekemeyer, K.2, Wilke, R. N.2, Salditt, T.2, Gulden, J.3, Mancuso, A. P.3, Vartanyants, I. A.3, Weckert, E.3, Schöder, S.4, Burghammer, M.4, Schroer, C. G.1
Source: Applied Physics Letters. 3/1/2010, Vol. 96 Issue 9, p091102. 3p. 1 Color Photograph, 2 Diagrams, 1 Graph.
Database: Academic Search Ultimate
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>. 3/1/2010, Vol. 96 Issue 9, p091102. 3p. 1 Color Photograph, 2 Diagrams, 1 Graph.
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