APA (7th ed.) Citation

Dubslaff, M., Hanke, M., Schöder, S., Burghammer, M., Boeck, T., & Patommel, J. (2010). X-ray nanodiffraction at individual SiGe/Si(001) dot molecules and its numerical description based on kinematical scattering theory. Applied Physics Letters, 96(13), 133107. https://doi.org/10.1063/1.3373916

Chicago Style (17th ed.) Citation

Dubslaff, M., M. Hanke, S. Schöder, M. Burghammer, T. Boeck, and J. Patommel. "X-ray Nanodiffraction at Individual SiGe/Si(001) Dot Molecules and Its Numerical Description Based on Kinematical Scattering Theory." Applied Physics Letters 96, no. 13 (2010): 133107. https://doi.org/10.1063/1.3373916.

MLA (9th ed.) Citation

Dubslaff, M., et al. "X-ray Nanodiffraction at Individual SiGe/Si(001) Dot Molecules and Its Numerical Description Based on Kinematical Scattering Theory." Applied Physics Letters, vol. 96, no. 13, 2010, p. 133107, https://doi.org/10.1063/1.3373916.