APA (7th ed.) Citation

SANGWAN, V. K., BALLAROTTO, V. W., SIEGRIST, K., & WILLIAMS, E. D. (2010). Characterizing voltage contrast in photoelectron emission microscopy. Journal of Microscopy, 238(3), 210. https://doi.org/10.1111/j.1365-2818.2009.03342.x

Chicago Style (17th ed.) Citation

SANGWAN, V. K., V. W. BALLAROTTO, K. SIEGRIST, and E. D. WILLIAMS. "Characterizing Voltage Contrast in Photoelectron Emission Microscopy." Journal of Microscopy 238, no. 3 (2010): 210. https://doi.org/10.1111/j.1365-2818.2009.03342.x.

MLA (9th ed.) Citation

SANGWAN, V. K., et al. "Characterizing Voltage Contrast in Photoelectron Emission Microscopy." Journal of Microscopy, vol. 238, no. 3, 2010, p. 210, https://doi.org/10.1111/j.1365-2818.2009.03342.x.