APA (7th ed.) Citation

Pogrebitsky, K. J., & Sharkov, M. D. (2010). Innovations in X-ray-induced electron emission spectroscopy (XIEES). Semiconductors, 44(6), 723. https://doi.org/10.1134/S1063782610060060

Chicago Style (17th ed.) Citation

Pogrebitsky, K. Ju, and M. D. Sharkov. "Innovations in X-ray-induced Electron Emission Spectroscopy (XIEES)." Semiconductors 44, no. 6 (2010): 723. https://doi.org/10.1134/S1063782610060060.

MLA (9th ed.) Citation

Pogrebitsky, K. Ju, and M. D. Sharkov. "Innovations in X-ray-induced Electron Emission Spectroscopy (XIEES)." Semiconductors, vol. 44, no. 6, 2010, p. 723, https://doi.org/10.1134/S1063782610060060.