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Innovations in X-ray-induced electron emission spectroscopy (XIEES).

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Title: Innovations in X-ray-induced electron emission spectroscopy (XIEES).
Authors: Pogrebitsky, K. Ju1 mischar@mail.ioffe.ru, Sharkov, M. D.1 mischar@mail.ioffe.ru
Source: Semiconductors. Jun2010, Vol. 44 Issue 6, p723-728. 6p. 2 Black and White Photographs, 2 Diagrams, 2 Graphs.
Database: Academic Search Ultimate
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  Data: Innovations in X-ray-induced electron emission spectroscopy (XIEES).
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  Data: <searchLink fieldCode="JN" term="%22Semiconductors%22">Semiconductors</searchLink>. Jun2010, Vol. 44 Issue 6, p723-728. 6p. 2 Black and White Photographs, 2 Diagrams, 2 Graphs.
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        Value: 10.1134/S1063782610060060
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              Text: Jun2010
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