APA (7th ed.) Citation

Fournier, K. B., Foord, M. E., Wilson, B. G., Glenzer, S. H., Wong, K. L., Thoe, R. S., . . . Springer, P. T. (2000). Using high resolution x-ray spectroscopy of laser and EBIT plasma sources to test atomic models. AIP Conference Proceedings, 547(1), 203. https://doi.org/10.1063/1.1361791

Chicago Style (17th ed.) Citation

Fournier, K. B., M. E. Foord, B. G. Wilson, S. H. Glenzer, K. L. Wong, R. S. Thoe, P. Beiersdorfer, and P. T. Springer. "Using High Resolution X-ray Spectroscopy of Laser and EBIT Plasma Sources to Test Atomic Models." AIP Conference Proceedings 547, no. 1 (2000): 203. https://doi.org/10.1063/1.1361791.

MLA (9th ed.) Citation

Fournier, K. B., et al. "Using High Resolution X-ray Spectroscopy of Laser and EBIT Plasma Sources to Test Atomic Models." AIP Conference Proceedings, vol. 547, no. 1, 2000, p. 203, https://doi.org/10.1063/1.1361791.