Using high resolution x-ray spectroscopy of laser and EBIT plasma sources to test atomic models.
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| Title: | Using high resolution x-ray spectroscopy of laser and EBIT plasma sources to test atomic models. |
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| Authors: | Fournier, K. B., Foord, M. E., Wilson, B. G., Glenzer, S. H., Wong, K. L., Thoe, R. S., Beiersdorfer, P., Springer, P. T. |
| Source: | AIP Conference Proceedings. 2000, Vol. 547 Issue 1, p203. 14p. |
| Database: | Academic Search Ultimate |
| ISSN: | 0094243X |
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| DOI: | 10.1063/1.1361791 |
