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Using high resolution x-ray spectroscopy of laser and EBIT plasma sources to test atomic models.

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Title: Using high resolution x-ray spectroscopy of laser and EBIT plasma sources to test atomic models.
Authors: Fournier, K. B., Foord, M. E., Wilson, B. G., Glenzer, S. H., Wong, K. L., Thoe, R. S., Beiersdorfer, P., Springer, P. T.
Source: AIP Conference Proceedings. 2000, Vol. 547 Issue 1, p203. 14p.
Database: Academic Search Ultimate
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  Availability: 0
Header DbId: asn
DbLabel: Academic Search Ultimate
An: 5665701
AccessLevel: 2
PubType: Conference
PubTypeId: conference
PreciseRelevancyScore: 0
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  Data: Using high resolution x-ray spectroscopy of laser and EBIT plasma sources to test atomic models.
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  Data: <searchLink fieldCode="AR" term="%22Fournier%2C+K%2E+B%2E%22">Fournier, K. B.</searchLink><br /><searchLink fieldCode="AR" term="%22Foord%2C+M%2E+E%2E%22">Foord, M. E.</searchLink><br /><searchLink fieldCode="AR" term="%22Wilson%2C+B%2E+G%2E%22">Wilson, B. G.</searchLink><br /><searchLink fieldCode="AR" term="%22Glenzer%2C+S%2E+H%2E%22">Glenzer, S. H.</searchLink><br /><searchLink fieldCode="AR" term="%22Wong%2C+K%2E+L%2E%22">Wong, K. L.</searchLink><br /><searchLink fieldCode="AR" term="%22Thoe%2C+R%2E+S%2E%22">Thoe, R. S.</searchLink><br /><searchLink fieldCode="AR" term="%22Beiersdorfer%2C+P%2E%22">Beiersdorfer, P.</searchLink><br /><searchLink fieldCode="AR" term="%22Springer%2C+P%2E+T%2E%22">Springer, P. T.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22AIP+Conference+Proceedings%22">AIP Conference Proceedings</searchLink>. 2000, Vol. 547 Issue 1, p203. 14p.
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        Value: 10.1063/1.1361791
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        Text: English
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              Text: 2000
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