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Uniformity study of wafer-scale InP-to-silicon hybrid integration.

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Title: Uniformity study of wafer-scale InP-to-silicon hybrid integration.
Authors: Liang, Di1 dliang@ece.ucsb.edu, Chapman, David2 chapman@ll.mit.edu, Li, Youli3 youli@mrl.ucsb.edu, Oakley, Douglas2 Oakley@ll.mit.edu, Napoleone, Tony2 napoleone@ll.mit.edu, Juodawlkis, Paul2, Brubaker, Chad4 c.brubaker@evgroup.com, Mann, Carl4 c.mann@evgroup.com, Bar, Hanan5 hanan.bar@intel.com, Raday, Omri5 omri.raday@intel.com, Bowers, John1 bowers@ece.ucsb.edu
Source: Applied Physics A: Materials Science & Processing. Apr2011, Vol. 103 Issue 1, p213-218. 6p. 1 Color Photograph, 2 Black and White Photographs, 2 Diagrams.
Database: Academic Search Ultimate
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Header DbId: asn
DbLabel: Academic Search Ultimate
An: 59524326
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Uniformity study of wafer-scale InP-to-silicon hybrid integration.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Liang%2C+Di%22">Liang, Di</searchLink><relatesTo>1</relatesTo><i> dliang@ece.ucsb.edu</i><br /><searchLink fieldCode="AR" term="%22Chapman%2C+David%22">Chapman, David</searchLink><relatesTo>2</relatesTo><i> chapman@ll.mit.edu</i><br /><searchLink fieldCode="AR" term="%22Li%2C+Youli%22">Li, Youli</searchLink><relatesTo>3</relatesTo><i> youli@mrl.ucsb.edu</i><br /><searchLink fieldCode="AR" term="%22Oakley%2C+Douglas%22">Oakley, Douglas</searchLink><relatesTo>2</relatesTo><i> Oakley@ll.mit.edu</i><br /><searchLink fieldCode="AR" term="%22Napoleone%2C+Tony%22">Napoleone, Tony</searchLink><relatesTo>2</relatesTo><i> napoleone@ll.mit.edu</i><br /><searchLink fieldCode="AR" term="%22Juodawlkis%2C+Paul%22">Juodawlkis, Paul</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Brubaker%2C+Chad%22">Brubaker, Chad</searchLink><relatesTo>4</relatesTo><i> c.brubaker@evgroup.com</i><br /><searchLink fieldCode="AR" term="%22Mann%2C+Carl%22">Mann, Carl</searchLink><relatesTo>4</relatesTo><i> c.mann@evgroup.com</i><br /><searchLink fieldCode="AR" term="%22Bar%2C+Hanan%22">Bar, Hanan</searchLink><relatesTo>5</relatesTo><i> hanan.bar@intel.com</i><br /><searchLink fieldCode="AR" term="%22Raday%2C+Omri%22">Raday, Omri</searchLink><relatesTo>5</relatesTo><i> omri.raday@intel.com</i><br /><searchLink fieldCode="AR" term="%22Bowers%2C+John%22">Bowers, John</searchLink><relatesTo>1</relatesTo><i> bowers@ece.ucsb.edu</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. Apr2011, Vol. 103 Issue 1, p213-218. 6p. 1 Color Photograph, 2 Black and White Photographs, 2 Diagrams.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=59524326
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s00339-010-5999-z
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 213
    Titles:
      – TitleFull: Uniformity study of wafer-scale InP-to-silicon hybrid integration.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Liang, Di
      – PersonEntity:
          Name:
            NameFull: Chapman, David
      – PersonEntity:
          Name:
            NameFull: Li, Youli
      – PersonEntity:
          Name:
            NameFull: Oakley, Douglas
      – PersonEntity:
          Name:
            NameFull: Napoleone, Tony
      – PersonEntity:
          Name:
            NameFull: Juodawlkis, Paul
      – PersonEntity:
          Name:
            NameFull: Brubaker, Chad
      – PersonEntity:
          Name:
            NameFull: Mann, Carl
      – PersonEntity:
          Name:
            NameFull: Bar, Hanan
      – PersonEntity:
          Name:
            NameFull: Raday, Omri
      – PersonEntity:
          Name:
            NameFull: Bowers, John
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 04
              Text: Apr2011
              Type: published
              Y: 2011
          Identifiers:
            – Type: issn-print
              Value: 09478396
          Numbering:
            – Type: volume
              Value: 103
            – Type: issue
              Value: 1
          Titles:
            – TitleFull: Applied Physics A: Materials Science & Processing
              Type: main
ResultId 1