APA (7th ed.) Citation

Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., . . . Cowley, R. A. (2011). Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction. Physical Review B: Condensed Matter & Materials Physics, 84(23), 233301-1. https://doi.org/10.1103/PhysRevB.84.233301

Chicago Style (17th ed.) Citation

Zhang, K. H. L., A. Regoutz, R. G. Palgrave, D. J. Payne, R. G. Egdell, A. Walsh, S. P. Collins, D. Wermeille, and R. A. Cowley. "Determination of the Poisson Ratio of (001) and (111) Oriented Thin Films of In2O3 by Synchrotron-based X-ray Diffraction." Physical Review B: Condensed Matter & Materials Physics 84, no. 23 (2011): 233301-1. https://doi.org/10.1103/PhysRevB.84.233301.

MLA (9th ed.) Citation

Zhang, K. H. L., et al. "Determination of the Poisson Ratio of (001) and (111) Oriented Thin Films of In2O3 by Synchrotron-based X-ray Diffraction." Physical Review B: Condensed Matter & Materials Physics, vol. 84, no. 23, 2011, pp. 233301-1, https://doi.org/10.1103/PhysRevB.84.233301.