Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction. - Zhang, K. H. L.; Regoutz, A.; Palgrave, R. G.; Payne, D. J.; Egdell, R. G; Walsh, A.; Collins, S. P.; Wermeille, D.; Cowley, R. A. (Physical Review B: Condensed Matter & Materials Physics, 2011)