Thakuria, R., Eddleston, M. D., Chow, E. H. H., Lloyd, G. O., Aldous, B. J., Krzyzaniak, J. F., . . . Jones, W. (2013). Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time. Angewandte Chemie, 125(40), 10735. https://doi.org/10.1002/ange.201302532
Chicago Style (17th ed.) CitationThakuria, Ranjit, Mark D. Eddleston, Ernest H. H. Chow, Gareth O. Lloyd, Barry J. Aldous, Joseph F. Krzyzaniak, Andrew D. Bond, and William Jones. "Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time." Angewandte Chemie 125, no. 40 (2013): 10735. https://doi.org/10.1002/ange.201302532.
MLA (9th ed.) CitationThakuria, Ranjit, et al. "Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time." Angewandte Chemie, vol. 125, no. 40, 2013, p. 10735, https://doi.org/10.1002/ange.201302532.