Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time.
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| Title: | Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time. |
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| Authors: | Thakuria, Ranjit1,2, Eddleston, Mark D.1, Chow, Ernest H. H.1, Lloyd, Gareth O.1, Aldous, Barry J.3, Krzyzaniak, Joseph F.4, Bond, Andrew D.5, Jones, William1 wj10@cam.ac.uk |
| Source: | Angewandte Chemie. Sep2013, Vol. 125 Issue 40, p10735-10738. 4p. |
| Database: | Academic Search Ultimate |
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| ISSN: | 00448249 |
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| DOI: | 10.1002/ange.201302532 |
