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Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time.

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Title: Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time.
Authors: Thakuria, Ranjit1,2, Eddleston, Mark D.1, Chow, Ernest H. H.1, Lloyd, Gareth O.1, Aldous, Barry J.3, Krzyzaniak, Joseph F.4, Bond, Andrew D.5, Jones, William1 wj10@cam.ac.uk
Source: Angewandte Chemie. Sep2013, Vol. 125 Issue 40, p10735-10738. 4p.
Database: Academic Search Ultimate
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An: 90470128
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  Data: Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time.
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  Data: <searchLink fieldCode="JN" term="%22Angewandte+Chemie%22">Angewandte Chemie</searchLink>. Sep2013, Vol. 125 Issue 40, p10735-10738. 4p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=90470128
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        Value: 10.1002/ange.201302532
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      – Code: eng
        Text: English
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        PageCount: 4
        StartPage: 10735
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      – TitleFull: Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time.
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            NameFull: Thakuria, Ranjit
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            NameFull: Eddleston, Mark D.
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            NameFull: Aldous, Barry J.
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            NameFull: Krzyzaniak, Joseph F.
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            – D: 27
              M: 09
              Text: Sep2013
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              Value: 125
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              Value: 40
          Titles:
            – TitleFull: Angewandte Chemie
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