A Functional Approach for Testing the Reorder Buffer Memory.
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| Title: | A Functional Approach for Testing the Reorder Buffer Memory. |
|---|---|
| Authors: | Di Carlo, S.1, Gaudesi, M.1 marco.gaudesi@polito.it, Sanchez, E.1, Sonza Reorda, M.1 |
| Source: | Journal of Electronic Testing. Aug2014, Vol. 30 Issue 4, p469-481. 13p. |
| Database: | Academic Search Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: asn DbLabel: Academic Search Ultimate An: 97565644 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=asn&AN=97565644 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10836-014-5461-9 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 469 Titles: – TitleFull: A Functional Approach for Testing the Reorder Buffer Memory. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Di Carlo, S. – PersonEntity: Name: NameFull: Gaudesi, M. – PersonEntity: Name: NameFull: Sanchez, E. – PersonEntity: Name: NameFull: Sonza Reorda, M. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Text: Aug2014 Type: published Y: 2014 Identifiers: – Type: issn-print Value: 09238174 Numbering: – Type: volume Value: 30 – Type: issue Value: 4 Titles: – TitleFull: Journal of Electronic Testing Type: main |
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