APA (7th ed.) Citation

Wu, X., Qiu, L., Gu, X., & Long, Z. (2021). Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation. IEEE Transactions on Instrumentation & Measurement, 70, 1. https://doi.org/10.1109/TIM.2020.3026801

Chicago Style (17th ed.) Citation

Wu, Xiaojun, LingTeng Qiu, Xiaodong Gu, and Zhili Long. "Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation." IEEE Transactions on Instrumentation & Measurement 70 (2021): 1. https://doi.org/10.1109/TIM.2020.3026801.

MLA (9th ed.) Citation

Wu, Xiaojun, et al. "Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation." IEEE Transactions on Instrumentation & Measurement, vol. 70, 2021, p. 1, https://doi.org/10.1109/TIM.2020.3026801.