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Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation.

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Title: Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation.
Authors: Wu, Xiaojun1 wuxj@hit.edu.cn, Qiu, LingTeng1 qiulingteng@stu.hit.edu.cn, Gu, Xiaodong2 dadong.gxd@alibaba-inc.com, Long, Zhili1 longzhili@hit.edu.cn
Source: IEEE Transactions on Instrumentation & Measurement. 2021, Vol. 70, p1-10. 10p.
Database: Business Source Ultimate
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An: 170414894
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PubType: Academic Journal
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TIM.2020.3026801
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      – Code: eng
        Text: English
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        PageCount: 10
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      – TitleFull: Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation.
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            NameFull: Wu, Xiaojun
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            NameFull: Qiu, LingTeng
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            NameFull: Gu, Xiaodong
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              Text: 2021
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              Y: 2021
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              Value: 70
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            – TitleFull: IEEE Transactions on Instrumentation & Measurement
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