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Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation.

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Bibliographic Details
Title: Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation.
Authors: Wu, Xiaojun1 wuxj@hit.edu.cn, Qiu, LingTeng1 qiulingteng@stu.hit.edu.cn, Gu, Xiaodong2 dadong.gxd@alibaba-inc.com, Long, Zhili1 longzhili@hit.edu.cn
Source: IEEE Transactions on Instrumentation & Measurement. 2021, Vol. 70, p1-10. 10p.
Database: Business Source Ultimate
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