APA (7th ed.) Citation

Macher, J. T. (2006). Technological Development and the Boundaries of the Firm: A Knowledge-Based Examination in Semiconductor Manufacturing. Management Science (INFORMS), 52(6), 826. https://doi.org/10.1287/mnsc.1060.0511

Chicago Style (17th ed.) Citation

Macher, Jeffrey T. "Technological Development and the Boundaries of the Firm: A Knowledge-Based Examination in Semiconductor Manufacturing." Management Science (INFORMS) 52, no. 6 (2006): 826. https://doi.org/10.1287/mnsc.1060.0511.

MLA (9th ed.) Citation

Macher, Jeffrey T. "Technological Development and the Boundaries of the Firm: A Knowledge-Based Examination in Semiconductor Manufacturing." Management Science (INFORMS), vol. 52, no. 6, 2006, p. 826, https://doi.org/10.1287/mnsc.1060.0511.