Technological Development and the Boundaries of the Firm: A Knowledge-Based Examination in Semiconductor Manufacturing.
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| Title: | Technological Development and the Boundaries of the Firm: A Knowledge-Based Examination in Semiconductor Manufacturing. |
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| Authors: | Macher, Jeffrey T.1 jtm4@georgetown.edu |
| Source: | Management Science (INFORMS). Jun2006, Vol. 52 Issue 6, p826-843. 18p. 5 Charts, 1 Graph. |
| Database: | Business Source Ultimate |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: bsu DbLabel: Business Source Ultimate An: 21019946 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=bsu&AN=21019946 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1287/mnsc.1060.0511 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 18 StartPage: 826 Titles: – TitleFull: Technological Development and the Boundaries of the Firm: A Knowledge-Based Examination in Semiconductor Manufacturing. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Macher, Jeffrey T. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2006 Type: published Y: 2006 Identifiers: – Type: issn-print Value: 00251909 Numbering: – Type: volume Value: 52 – Type: issue Value: 6 Titles: – TitleFull: Management Science (INFORMS) Type: main |
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