A Multicycle Test Set Based on a Two-Cycle Test Set With Constant Primary Input Vectors.
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| Title: | A Multicycle Test Set Based on a Two-Cycle Test Set With Constant Primary Input Vectors. |
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| Authors: | Pomeranz, Irith1 |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jul2015, Vol. 34 Issue 7, p1124-1132. 9p. |
| Subjects: | Test generators, Finite state machines, Computer simulation, Sequential machine theory, Vectors (Calculus) |
| Abstract: | Test compaction can be achieved by using multicycle tests. To avoid the computationally intensive process of sequential test generation, multicycle tests can be generated by extending two-cycle tests. However, the scan-in state of a two-cycle test is not always effective for a multicycle test when the primary input vectors are held constant during the functional clock cycles of a test. This paper studies the extent of this issue by considering exhaustive two-cycle and multicycle test sets with constant primary input vectors for finite-state machine benchmarks. Based on the results of this study, it describes an efficient test compaction procedure that modifies selected two-cycle tests in a given test set in order to make them more effective as a source for multicycle tests with constant primary input vectors. Experimental results are presented to demonstrate the importance of this step to test compaction. [ABSTRACT FROM PUBLISHER] |
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| Database: | Engineering Source |
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