APA (7th ed.) Citation

Takahashi, T., Ukai, M., Yoshida, A., Fujii, Y., Dobashi, K., Hashimoto, O., . . . Watanabe, T. (2003). Radiation damage of silicon microstrip detectors by high doses of <f>200 MeV</f> electrons. Nuclear Instruments & Methods in Physics Research Section A, 511(3), 328. https://doi.org/10.1016/S0168-9002(03)01975-2

Chicago Style (17th ed.) Citation

Takahashi, T., et al. "Radiation Damage of Silicon Microstrip Detectors by High Doses of 200 MeV Electrons." Nuclear Instruments & Methods in Physics Research Section A 511, no. 3 (2003): 328. https://doi.org/10.1016/S0168-9002(03)01975-2.

MLA (9th ed.) Citation

Takahashi, T., et al. "Radiation Damage of Silicon Microstrip Detectors by High Doses of 200 MeV Electrons." Nuclear Instruments & Methods in Physics Research Section A, vol. 511, no. 3, 2003, p. 328, https://doi.org/10.1016/S0168-9002(03)01975-2.